Interface magnetic anisotropy of Pd/Co2FexMn1-xSi/MgO layered structures

Abstract

Interface magnetic anisotropy of Co2FexMn1-xSi Heusler alloy thin films were studied quantitatively. Films of Co2MnSi (x = 1, CMS), Co2Fe0.5Mn0.5Si (x = 0.5, CFMS), and Co2FeSi (x = 1, CFS) were fabricated onto MgO (001) substrates with an epitaxially grown Pd (001) under layer, and were capped by an MgO layer. The maximum thickness for the perpendicular magnetization was 0.8 nm for CMS and CFMS, and it was 0.6 nm for CFS. The interface anisotropy energies (Ks) were 1.5, 1.5, and 1.2 erg/cm2 for CMS, CFMS, and CFS, respectively. The difference in Ks probably originated from the different alloying conditions at the bottom interface between Pd and Co2FexMn1-xSi layers.