Abstract
Nanomechanical resonators can be fabricated to achieve high natural resonance frequencies, approaching 1 GHz, with quality factors in excess of 10 4. These resonators are candidates for use as highly selective rf filters and as precision on-chip clocks. Some fundamental and some nonfundamental noise processes will present limits to the performance of such resonators. These include thermomechanical noise, Nyquist-Johnson noise, and adsorption-desorption noise; other important noise sources include those due to thermal fluctuations and defect motion-induced noise. In this article, we develop a self-contained formalism for treating these noise sources, and use it to estimate the impact that these noise processes will have on the noise of a model nanoscale resonator, consisting of a doubly clamped beam of single-crystal Si with a natural resonance frequency of 1 GHz. © 2002 American Institute of Physics. © 2002 American Institute of Physics.
Cite
CITATION STYLE
Cleland, A. N., & Roukes, M. L. (2002). Noise processes in nanomechanical resonators. Journal of Applied Physics, 92(5), 2758–2769. https://doi.org/10.1063/1.1499745
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