Fresnel diffraction correction by phase-considered iteration procedure in soft X-ray projection microscopy

Abstract

In soft X-ray projection microscopy, it is easy to alter the magnification by changing the distance between the pinhole and the specimen, while the image is blurred because the soft X-rays are diffracted through the propagation from specimen to CCD detector. We corrected the blurred image by the iteration procedure of Fresnel to inverse Fresnel transformation taking phase distribution of the specimen into account. The experiments were conducted at the BL-11A of the Photon Factory, KEK, Japan for the specimens such as glass-capillaries, latex-particles, dried mammalian cells and human chromosomes. Many of those blurred images were corrected adequately by the iteration procedure, though some images such as those which have high-contrast or are overlapped by small cells still remain to be improved. © 2009 IOP Publishing Ltd.