Peculiarities of the Vanadium Oxidation Degree Determination by XPS Method in Nanodispersed Oxide Systems

Abstract

An analysis of our data and literature data on the vanadium oxidation degree (n) by the XPS method in its oxide systems was performed. It was shown that the equation proposed in the literature allows one to correctly estimate this value for microsized systems, while there is a significant difference (up to n ± 0.3) between the actual and calculated values for the nanosized systems. A modified equation is proposed that allows one to estimate the vanadium oxidation degree in nanodispersed systems with higher accuracy (up to n ± 0.15).