Correction of axial position uncertainty and systematic detector errors in ptychographic diffraction imaging

Abstract

© 2018 The Authors. Ptychography is a diffraction imaging method that allows one to solve inverse problems in microscopy with the ability to retrieve information about and correct for systematic errors. Here, we propose techniques to correct for axial position uncertainty, detector point spread, and inhomogeneous detector response using ptychography's inherent self-calibration capabilities. The proposed methods are tested with visible light and X-ray experimental data. We believe that the results are important for precise calibration of ptychographic experimental setups and rigorous quantification of partially coherent beams by means of ptychography.