Pruning random resistive memory for optimizing analog AI

0Citations
Citations of this article
13Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

The rapid expansion of AI models has intensified concerns over energy consumption. Analog in-memory computing with resistive memory offers a promising, energy-efficient alternative, yet its practical deployment is hindered by programming challenges and device non-idealities. Here, we propose a software-hardware co-design that trains randomly weighted resistive-memory neural networks via edge-pruning topology optimization. Software-wise, we tailor the network topology to extract high-performing sub-networks without precise weight tuning, enhancing robustness to device variations and reducing programming overhead. Hardware-wise, we harness the intrinsic stochasticity of resistive-memory electroforming to generate large-scale, low-cost random weights. Implemented on a 40 nm resistive memory chip, our co-design yields accuracy improvements of 17.3% and 19.9% on Fashion-MNIST and Spoken Digit, respectively, and a 9.8% precision-recall AUC improvement on DRIVE, while reducing energy consumption by 78.3%, 67.9%, and 99.7%. We further demonstrate broad applicability across analog memory technologies and scalability to ResNet-50 on ImageNet-100.

Cite

CITATION STYLE

APA

Li, Y., Wang, S., Zhao, Y., Wang, S., Wang, B., Zhang, W., … Liu, M. (2026). Pruning random resistive memory for optimizing analog AI. Nature Communications , 17(1). https://doi.org/10.1038/s41467-025-67960-6

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free