Photoluminescence enhancement through vertical stacking of defect-engineered Ge on Si quantum dots

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Abstract

In this work, we show that the room-temperature photoluminescence intensity from Ge ion-bombarded (GIB) epitaxial Ge on Si quantum dots (QD) can be improved by their vertical stacking. We stress that the growth of GIB-QD multilayers is more demanding compared to all-crystalline epitaxial QDs, as a consequence of local amorphous regions within the GIB-QDs required during their genesis. We show that in spite of those amorphous regions, for accurately chosen growth temperatures of the Si spacer layers separating the GIB-QD layers, multiple GIB-QD layers can be stacked without detrimental break-down of epitaxial growth. Compared to a single GIB-QD layer, we observe a 650% increase in PL intensity for an eleven-layer GIB-QD stack, indicating that such multilayers are promising candidates as gain material for all-group-IV nano-photonic lasers.

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Groiss, H., Spindlberger, L., Oberhumer, P., Schäffler, F., Fromherz, T., Grydlik, M., & Brehm, M. (2017). Photoluminescence enhancement through vertical stacking of defect-engineered Ge on Si quantum dots. Semiconductor Science and Technology, 32(2). https://doi.org/10.1088/1361-6641/aa5697

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