Ultra high-speed 3-dimensional profilometry using a laser grating projection system

Abstract

The grating projection method with phase-shifting technique is very useful in measuring the 3-dimensional (3D) shape with high accuracy and speed. In this work, we have developed an ultra high-speed digital laser grating projection system using a high-power laser diode and a highsensitivity CMOS camera. With our system, the optical measurement required to find out the profile of a 3D object could be carried out within 2.6 ms, which is a significant (~10 times) improvement compared with those of the previous studies.