High-voltage diffusion-welded stacks on the basis of SiC Schottky diodes

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Abstract

In the present work we have considered the prototype of a high-voltage diode stack made on the basis of commercial SiC Schottky diodes. Implementation of vertical integration for four diode chips yielded a stack with a reverse current of 25 μA under a reverse voltage of 6 kV. The capacitance of the stack at zero bias was reduced more than three-fold in comparison with the initial diodes. The reverse recovery time of the stack was 7.4 ns. This paper proposes a convenient analytical approach to the estimation of parameters of modular compositions with vertical architecture.

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Korolkov, O., Sleptsuk, N., Annus, P., Land, R., & Rang, T. (2016). High-voltage diffusion-welded stacks on the basis of SiC Schottky diodes. In Materials Science Forum (Vol. 858, pp. 790–794). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.858.790

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