An X-ray nanodiffraction technique for structural characterization of individual nanomaterials

Abstract

An X-ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion-device beamline of the Advanced Photon Source. Using the extremely high brightness of the third-generation synchrotron radiation source and advanced high-resolution high-energy zone-plate focusing optics, X-rays of energies from 6 to 12 keV have been focused into a spot smaller than 200 nm with a photon density gain of more than 50 000 so that significant photon flux can be intercepted by a nanoscale material to generate a measurable diffraction signal for structural characterization. This paper describes the instrumentation of the technique and discusses the application of the technique to studies of tin oxide nanobelts. © 2005 International Union of Crystallography Printed in Great Britain - all rights reserved.