Monitoring nonlinear profiles using support vector machines

47Citations
Citations of this article
20Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

In this work we focus on the use of SVMs for monitoring techniques applied to nonlinear profiles in the Statistical Process Control (SPC) framework. We develop a new methodology based on Functional Data Analysis for the construction of control limits for nonlinear profiles. In particular, we monitor the fitted curves themselves instead of monitoring the parameters of any model fitting the curves. The simplicity and effectiveness of the data analysis method has been tested against other statistical approaches using a standard data set in the process control literature. © Springer-Verlag Berlin Heidelberg 2007.

Cite

CITATION STYLE

APA

Moguerza, J. M., Muñoz, A., & Psarakis, S. (2007). Monitoring nonlinear profiles using support vector machines. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 4756 LNCS, pp. 574–583). https://doi.org/10.1007/978-3-540-76725-1_60

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free