Abstract
This paper describes an application of infrared light-induced de-polarization applied on a polarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence of a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties of a CdZnTe detector. CdZnTe detectors operating under high radiation fluxes usually suffer from the polarization effect, which occurs due to a screening of the internal electric field by a positive space charge caused by photogenerated holes trapped at a deep level. Polarization results in the degradation of detector charge collection efficiency. We studied the spectroscopic behavior of CdZnTe under various X-ray fluxes ranging between 5 × 105 and 8 × 106 photons per mm2 per second. It was observed that polarization occurs at an X-ray flux higher than 3×106 mm−2·s−1. Using simultaneous illumination of the detector by a de-polarizing LED at 1200 nm, it was possible to recover X-ray spectra originally deformed by the polarization effect.
Author supplied keywords
Cite
CITATION STYLE
Pekárek, J., Dědič, V., Franc, J., Belas, E., Rejhon, M., Moravec, P., … Voltr, J. (2016). Infrared LED enhanced spectroscopic CdZnTe detectorworking under high fluxes of X-rays. Sensors (Switzerland), 16(10). https://doi.org/10.3390/s16101591
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.