Abstract
This paper presents our recent studies on GaN-on-Si devices and technologies for RF and microwave applications. The considerations of layer structure and fabrication technology are reviewed including two different GaN-based heterostructures and optimization of ohmic and Schottky contacts. Also, the proposed novel approaches for achieving high speed GaN-on-Si HEMTs are addressed such as the hybrid-drain structure and silicon substrate removal technology. Finally, the small-signal equivalent circuit model is employed to analyze the parasitic effects of silicon substrate for the device at high frequencies.
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CITATION STYLE
Hsu, S. S. H., Tsou, C. W., Lian, Y. W., & Lin, Y. S. (2016). GaN-on-silicon devices and technologies for RF and microwave applications. In RFIT 2016 - 2016 IEEE International Symposium on Radio-Frequency Integration Technology. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/RFIT.2016.7578151
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