Trigger specific failure in LED system by power and duty cycle patterns lifetime testing

Abstract

A standard test method for lifetime testing in the field of semiconductor devices is the active cycling test, which also finds its application for LEDs. In this work, different boundary conditions of reliability testing, applied at power and duty cycles, are discussed. A workflow for developing a testing procedure, aligned to the device under investigation, is presented. A validated finite volume simulation is used to verify the structure levels of an LED application and to study temperature time evolution by active cycling. The different active cycling parameters can be adjusted in such a way that different failure modes are triggered. The right choice of parameters, hence the optimized testing strategy, will lead to a time reduction of the lifetime testing and improve LED service testing.