Abstract
In this article results of complete modelling of electromagnetic field distribution in a near-field scanning probe microscope (NSOM) are presented. It is shown, that using finite difference in time domain method the NSOM signal can be computed for real tip-sample geometry. The results of such a simulation can be used to predict presence and distribution of topography related artefacts in NSOM images. © 2007 IOP Publishing Ltd.
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APA
Klapetek, P., & Burík, J. (2007). Artefacts in near-field optical microscopy. Journal of Physics: Conference Series, 61(1), 570–575. https://doi.org/10.1088/1742-6596/61/1/115
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