Multi-contrast computed laminography at ANKA light source

Abstract

X-ray computed laminography has been developed as a non-destructive imaging technique for inspecting laterally extended objects. Benefiting from a parallel-beam geometry, high photon flux of synchrotron sources and modern high-resolution detector systems, synchrotron radiation computed laminography (SRCL) results in a powerful three-dimensional microscopy technique. SRCL can be combined with different contrast modes, such as absorption, phase and dark-field contrasts, in order to provide complementary information for the same specimen. Here we show the development of SRCL at the TopoTomo beamline of the ANKA light source. A novel instrumentation design is reported and compared to the existing one. For this design, experimental results from different contrast modalities are shown. © Published under licence by IOP Publishing Ltd.