Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

Abstract

The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system. © 2010 IOP Publishing Ltd.