Measurement of local stress components in single crystal alumina by using raman microspectroscopy with sub-micro spatial resolution

Abstract

Recently, it is very important to grasp the stress states in sub-micro scale area. In this study, components of stresses/strains in a single crystal sapphire are determined by Raman microspectroscopy with sub-micro spatial resolution. The sapphire belongs to a D 3d point group with two Aig and five Eg vibration mode Raman lines. First, the relationships between the change of Raman shift and strain components for A 1g and E g modes are theoretically derived based on energy change under mechanical loading. In these equations, 20 unknown parameters are included. Second, these parameters are experimentally determined. In A 1g and E g modes, the relationships between Raman shift and applied strain indicate the linearity. Third, components of strains are determined by Raman microspectroscopy, and stresses are calculated by using Hook's law. Last, stress measurements around the notch root in the single crystal sapphire are conducted. The measured stresses are good agreement with the FEM results. Therefore, the applicability of Raman microspectroscopy to stresses/strains measurement in micro scale area is confirmed. © 2009 The Society of Materials Science, Japan.