Study of Plane Defects in the Cementite by Transmission Electron Microscopy

  • Nishiyama Z
  • Kore’eda A
  • Katagiri S
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Abstract

Cementitie foils extracted from annealed steels were examined by transmission electron microscopy employ-ing a specimen-tilting device. Sometimes a number of parallel straitions were observed. It was interpreted that they were due to the plane defects: stacking faults or sequence faults on (001), and sequence faults on (010), (100), (011), (103), (021), (111) and (212).

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Nishiyama, Z., Kore’eda, A., & Katagiri, S. (1964). Study of Plane Defects in the Cementite by Transmission Electron Microscopy. Transactions of the Japan Institute of Metals, 5(2), 115–121. https://doi.org/10.2320/matertrans1960.5.115

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