Diffuse Reflectance Measurements by Infrared Fourier Transform Spectrometry

Abstract

An optical system for diffuse reflectance infrared spectrometry is described. The device uses an on-axis ellipsoidal collecting mirror and a commercial Fourier transform spectrometer. Almost any type of powdered sample can be studied and the feasibility of good quantitative analysis is discussed. Sub-microgram detection limits are found for samples dispersed in KCI and for materials chromatographically separated directly on TLC plates. Results indicating the possibility of studying heterogeneous reactions of gases with powdered solids are shown. © 1978, American Chemical Society. All rights reserved.