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Reliability challenges for GaN-based FETs

  • Kuball M
  • Uren M
  • Pomeroy J
  • et al.
DOI: 10.7567/ssdm.2016.n-4-01
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Kuball, M., Uren, M., Pomeroy, J., Karboyan, S., Chatterjee, I., Liu, D., … Brazzini, T. (2019). Reliability challenges for GaN-based FETs. Japan Society of Applied Physics. https://doi.org/10.7567/ssdm.2016.n-4-01

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