Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Hüe, F., Maiden, A., Rodenburg, J., & Midgley, P. (2010). Quantitative Phase Retrieval by Ptychography in TEM. Microscopy and Microanalysis, 16(S2), 748–749. https://doi.org/10.1017/s1431927610056278
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