Abstract
Highly brilliant X-rays delivered by third generation synchrotron facilities coupled with modern detector technology permit routinely acquisition of high resolution tomograms in few minutes, making high throughput experiments a reality and bringing real-time tomography closer. New solutions for fast post-processing of such large amount of data are mandatory to fully exploit advantages provided by the high acquisition speed enabling new experiments until recently even unimaginable. The TOMCAT beamline 1 is well equipped for fast and high throughput experiments 2, 3 . Here, we will focus on our solutions regarding the reconstruction process and discuss a fast reconstruction algorithm 4 , based on the Fourier Transform method as opposed to slower standard Filtered Back-Projection routines. We perform the critical step of such method, the polar-to-Cartesian mapping in the Fourier space, by convolution with the Fourier transform of functions with particular characteristics. This convolution approach combines speed with accuracy, making real-time data postprocessing closer to reality. This fast reconstruction algorithm implemented at TOMCAT also features several plug-ins, aimed at taming reconstruction artifacts. Here, we will discuss a new approach for removing rings from reconstructed datasets arising from defective detector pixels and/or damaged scintillator screens. This new method is based on a combined wavelet- FFT decomposition 5 . Another important feature of the presented reconstruction algorithm deals with local tomographic datasets, characterized by incomplete data. We show here that ad-hoc padding of the sinograms prior to reconstruction significantly reduces typical artifacts related to data incompleteness, making local tomography a valuable acquisition mode when small volumes in relatively large samples are of interest. © 2010 Copyright SPIE - The International Society for Optical Engineering.
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CITATION STYLE
Marone, F., Münch, B., & Stampanoni, M. (2010). Fast reconstruction algorithm dealing with tomography artifacts. In Developments in X-Ray Tomography VII (Vol. 7804, p. 780410). SPIE. https://doi.org/10.1117/12.859703
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