Abstract
Imaging ellipsometry studies of graphene on SiO2 /Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated. © 2010 American Institute of Physics.
Cite
CITATION STYLE
Wurstbauer, U., Röling, C., Wurstbauer, U., Wegscheider, W., Vaupel, M., Thiesen, P. H., & Weiss, D. (2010). Imaging ellipsometry of graphene. Applied Physics Letters, 97(23). https://doi.org/10.1063/1.3524226
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
