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Electrodeposited metallic nanowires as a scanning probe tip

Materials Research Society Symposium Proceedings (2010) 1206 34-39
DOI: 10.1149/ma2010-02/18/1337
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Abstract

This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results. © 2010 Materials Research Society.

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Motoyama, M., & Prinz, F. B. (2010). Electrodeposited metallic nanowires as a scanning probe tip. In Materials Research Society Symposium Proceedings (Vol. 1206, pp. 34–39). https://doi.org/10.1149/ma2010-02/18/1337

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