A novel 2-D position sensitive silicon detector with micron resolution for heavy ion tracking

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Abstract

A new 2-D position sensitive silicon detector for tracking of energetic heavy ions is under development in a program to study the radiation effect within a single human cell. The detector is based on a concept of interleaved pixel electrodes arranged in a projective 2-D strip readout (stripixel). A fine position resolution in the sub-micron range can be achieved by determining the centroid of the charge collected on pixel electrodes with a granularity in the range of 10 μm. Beam test results with 1 GeV/n Fe ions have demonstrated an rms position resolution of about 0.5 μm with a 30 μm pixel pitch. © 2006 IEEE.

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Yu, B., Beuttenmuller, R., Chen, W., Elliott, D. C., Li, Z., Mead, J. A., … Rusek, A. (2006). A novel 2-D position sensitive silicon detector with micron resolution for heavy ion tracking. In IEEE Transactions on Nuclear Science (Vol. 53, pp. 2416–2420). https://doi.org/10.1109/TNS.2006.879164

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