Abstract
The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the photoluminescence spectra.
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CITATION STYLE
APA
Syari’Ati, A., Kumar, S., Zahid, A., Ali El Yumin, A., Ye, J., & Rudolf, P. (2019). Photoemission spectroscopy study of structural defects in molybdenum disulfide (MoS2) grown by chemical vapor deposition (CVD). Chemical Communications, 55(70), 10384–10387. https://doi.org/10.1039/c9cc01577a
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