Study on evaluation methods for mechanical properties of organic semiconductor materials

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Abstract

This paper describes the evaluation method of the mechanical properties of the materials constituting organic semiconductor, and the test result of the relation between applied strain and the fracture of thin films. The final target of this work is the improvement of flexibility of organic light emitting diode(OLED), the tensile test of the thin films coated on flexible substrate is conducted, and the vulnerable parts of the constituent material of the OLED is quantitatively understood, further the guideline for designing OLED structure will be obtained. In the present paper, tensile test of an aluminium oxide thin films deposited on a poly-ethylene-tere-phtalate (PET) substrate was carried out under constant conditions, the following results were obtained:(1)Cracking of the aluminium oxide thin films was observed using an optical transparent formula microscope at more than 40 times magnification; (2)Cracking was initiated at a strain of about 3%; (3)the number of cracks increased proportional to the strain, and saturated at about 9% strain; (4)Organic thin films α-NPD caused the same cracking as oxide thin films.

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Kobayashi, T., Yokoyama, T., Utsumi, Y., Kanematsu, H., & Masuda, T. (2013). Study on evaluation methods for mechanical properties of organic semiconductor materials. In Journal of Physics: Conference Series (Vol. 433). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/433/1/012009

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