Abstract
A full-scale piezo bendable mirror built as a prototype for an offset mirror at the European XFEL is characterized. The piezo ceramic elements are glued onto the mirror substrate, side-face on with respect to the reflecting surface. Using a nanometre optical component measuring machine and a large-aperture Fizeau interferometer, the mirror profile and influence functions were characterized, and further analysis was made to investigate the junction effect, hysteresis, twisting and reproducibility.
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Vannoni, M., Freijo Martín, I., Siewert, F., Signorato, R., Yang, F., & Sinn, H. (2016). Characterization of a piezo bendable X-ray mirror. In Journal of Synchrotron Radiation (Vol. 23, pp. 169–175). International Union of Crystallography. https://doi.org/10.1107/S1600577515019803
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