An active learning method, called Two-stage Active learning algorithm (TAL), is developed for software defect prediction. Combining the clustering and support vector machine techniques, this method improves the performance of the predictor with less labeling effort. Experiments validate its effectiveness. © 2012 The Institute of Electronics, Information and Communication Engineers.
CITATION STYLE
Luo, G., Ma, Y., & Qin, K. (2012). Active learning for software defect prediction. IEICE Transactions on Information and Systems, E95-D(6), 1680–1683. https://doi.org/10.1587/transinf.E95.D.1680
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