Journal ArticleOPEN ACCESS

The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

  • Yazdi S
  • Kasama T
  • Beleggia M
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 1502-1503
DOI: 10.1017/s1431927613009501
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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APA

Yazdi, S., Kasama, T., Beleggia, M., Ciechonski, R., Kryliouk, O., & Wagner, J. B. (2013). The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement. Microscopy and Microanalysis, 19(S2), 1502–1503. https://doi.org/10.1017/s1431927613009501

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