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Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography

  • Rouvière J
  • Béché A
  • Denneulin T
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1068-1069
DOI: 10.1017/s1431927611006210
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Rouvière, J., Béché, A., Denneulin, T., & Cooper, D. (2011). Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography. Microscopy and Microanalysis, 17(S2), 1068–1069. https://doi.org/10.1017/s1431927611006210

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