Scratching and brittle fracture of semiconductor in-situ scanning electron microscope

Wasmer, K., Pouvreau, C., Giovanola, J., & Michler, J. (2006). Scratching and brittle fracture of semiconductor in-situ scanning electron microscope. In Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture (pp. 117–118). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-4972-2_56