Compensation and carrier trapping in indium-doped CdTe: Contributions from an important near-mid-gap donor

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Abstract

We report on the recharging of the neutral state of a deep-donor layer that increases the efficiency of charge collection in detector-grade CdTe:In. Measurements with photoinduced current transient spectroscopy and thermoelectric effect spectroscopy revealed positively charged energy level at EC -0.65 eV. Photoluminescence measurements identified this level being responsible for the 0.68 eV emission band. Its positive charge is converted into a neutral one by the upward displacement of Fermi level. We discuss the nature of this deep defect based on the latest ab initio calculations. © 2009 American Institute of Physics.

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Babentsov, V., Franc, J., & James, R. B. (2009). Compensation and carrier trapping in indium-doped CdTe: Contributions from an important near-mid-gap donor. Applied Physics Letters, 94(5). https://doi.org/10.1063/1.3073738

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