High-gain and high-bandwidth AlGaN/GaN high electron mobility transistor comparator with high-temperature operation

23Citations
Citations of this article
13Readers
Mendeley users who have this article in their library.
Get full text

Abstract

This paper presents the dc and dynamic characterizations of a GaN-based voltage comparator, fabricated with monolithic integration of enhancement-mode (E-mode) and depletion-mode (D-mode) AlGaN/GaN high electron mobility transistors (HEMTs). The comparator features high gain (> 31 dB) and wide bandwidth (> 4 MHz), and small propagation delay time (< 20 ns) over a wide temperature range up to 250 °C. Its dc gain is still 27.1 dB at 400 °C. These results demonstrate the potential of the AlGaN/GaN HEMT technology for mixed-signal integrated circuits used in GaN power electronics that promises high-voltage, high-current, and high-temperature operation. © 2011 The Japan Society of Applied Physics.

Cite

CITATION STYLE

APA

Kwan, A. M. H., Wong, K. Y., Liu, X., & Chen, K. J. (2011). High-gain and high-bandwidth AlGaN/GaN high electron mobility transistor comparator with high-temperature operation. Japanese Journal of Applied Physics, 50(4 PART 2). https://doi.org/10.1143/JJAP.50.04DF02

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free