Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions

Abstract

Here, we introduce bimodal atomic force microscopy operated with sub-nm and ultra-small, i.e., sub-angstrom, first and second mode amplitudes in ambient conditions. We show how the tip can be made to oscillate in the proximity of the surface and in perpetual contact with the adsorbed water layers while the second mode amplitude and phase provide enhanced contrast and sensitivity. Nonlinear and nonmonotonic behavior of the experimental observables is discussed theoretically with a view to high resolution, enhanced contrast, and minimally invasive mapping. Fractions of meV of energy dissipation are shown to provide contrast above the noise level. © 2013 AIP Publishing LLC.