The influence of La content on properties of PLZT thin films

Abstract

The polycrystalline complex compounds of PLZT, the formula (Pb 1-xLax)(Zr0.52Ti0.48)O3 (x = 0.10, 0.15, 0.20 and 0.25), were fabricated by sol-gel method. the influence of La content on the microstructure, optical properties and electrical properties of PLZT materials were studied. Phase characterization and crystal orientation of the PLZT films was investigated by X-ray diffraction analysis. The extinction coefficient k of the films drops dramatically in the range of 300-500 nm, and reduces to 0.0355, 0.0357 and 0.0451 with the La concentration of 15%, 20% and 25%, respectively, when the wavelength is larger than 550 nm. The remnant polarization of the films decreases with the La content increasing.