Time-of-Flight Secondary Ion Mass Spectrometry Analyses of Self-Assembled Monolayers of Octadecyltrimethoxysilane on SiO2 Substrate

3Citations
Citations of this article
11Readers
Mendeley users who have this article in their library.

Abstract

The self-assembled monolayers (SAMs) of organosilanes formed on an oxide substrate are thought to have a polymerized –Si–O–Si– network due to the homocondensation of silanols of hydrolyzed silane headgroups, which is the most significant difference in the SAMs of organosi-lanes in comparison with those of alkanethoils and organophsosphonic acids. In order to explore the interface chemistry of organosilane SAMs, surface-sensitive time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to compare ion fragmentation differences between the SAMs of octadecyltrimethoxysilane (OTMS) formed on a SiO2 substrate and free OTMS molecules, as well as oxide substrate. The ability of ToF-SIMS to verify the hydrolysis of the methoxy groups of OTMS molecules and to assess the polymerized –Si–O–Si– network in their SAMs was demonstrated, which shows that ToF-SIMS provides unique information to help us understand the interface chemistry of OTMS SAMs formed on oxides.

Cite

CITATION STYLE

APA

Nie, H. Y., & Jahangiri-Famenini, H. R. (2022). Time-of-Flight Secondary Ion Mass Spectrometry Analyses of Self-Assembled Monolayers of Octadecyltrimethoxysilane on SiO2 Substrate. Applied Sciences (Switzerland), 12(10). https://doi.org/10.3390/app12104932

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free