Abstract
Aim: To detect pathological brain conditions early is a core procedure for patients so as to have enough time for treatment. Traditional manual detection is either cumbersome, or expensive, or time-consuming. We aimto offer a systemthat can automatically identify pathological brain images in this paper.Method: We propose a novel image feature, viz., Fractional Fourier Entropy (FRFE), which is based on the combination of Fractional Fourier Transform(FRFT) and Shannon entropy. Afterwards, theWelch's t-test (WTT) andMahalanobis distance (MD) were harnessed to select distinguishing features. Finally, we introduced an advanced classifier: Twin support vector machine (TSVM). Results: A 10 × K-fold stratified cross validation test showed that this proposed "FRFE +WTT + TSVM" yielded an accuracy of 100.00%, 100.00%, and 99.57% on datasets that contained 66, 160, and 255 brain images, respectively. Conclusions: The proposed "FRFE +WTT + TSVM" method is superior to 20 state-of-the-art methods.
Author supplied keywords
Cite
CITATION STYLE
Wang, S., Zhang, Y., Yang, X., Sun, P., Dong, Z., Liu, A., & Yuan, T. F. (2015). Pathological brain detection by a novel image feature-fractional fourier entropy. Entropy, 17(12), 8278–8296. https://doi.org/10.3390/e17127877
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.