Journal ArticleOPEN ACCESS

Advanced Interconnects: Materials, Processing, and Reliability

  • Baklanov M
  • Adelmann C
  • Zhao L
  • et al.
ECS Journal of Solid State Science and Technology (2015) 4(1) Y1-Y4
DOI: 10.1149/2.0271501jss
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Abstract

Simulation of charged and excited particle transport in the low-current discharge in argon-mercury mixture G G Bondarenko, M R Fisher and V I Kristya-Effect of zirconium addition on welding of aluminum grain refined by titanium plus boron A I O Zaid-This content was downloaded from IP address 43.239.95.41 on 18/03/2026 at 16:44

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Baklanov, M. R., Adelmann, C., Zhao, L., & De Gendt, S. (2015). Advanced Interconnects: Materials, Processing, and Reliability. ECS Journal of Solid State Science and Technology, 4(1), Y1–Y4. https://doi.org/10.1149/2.0271501jss

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