Prediction of parental combination for introduction of stay-green associated loci in wheat

Abstract

In wheat, the increase of yield and stability associated traits can be achieved by combining parents containing the stay-green trait and favorable alleles for grain yield. The aim of this work was to analyze the genetic dissimilarity between wheat lines from stay-green and synchronized maturation groups and elite cultivars. Moreover, to propose promising combinations seeking the selection of high-grain yield and high bread-making quality genotypes containing stay-green trait. The experiment was conducted in a randomized block design with three replications in 2003, 2004, and 2005, using sister-lines with the presence and absence of stay-green trait and elite cultivars. Genetic variability exists among wheat strains from the synchronized stay-green maturation group and elite cultivars. Genotypes of maturation group stay-green obtained an average performance superior to the synchronized group. Crosses between stay-green lines and the CEP 29 and BRS 177 cultivars are promising in the selection of genotypes carrying the stay-green trait with high yield and bread-making quality.