A wide spectral range reflectance and luminescence imaging system

Abstract

In this study, we introduce a wide spectral range (200-2500 nm) imaging system with a 250 μm minimum spatial resolution, which can be freely modified for a wide range of resolutions and measurement geometries. The system has been tested for reflectance and luminescence measurements, but can also be customized for transmittance measurements. This study includes the performance results of the developed system, as well as examples of spectral images. Discussion of the system relates it to existing systems and methods. The wide range spectral imaging system that has been developed is however highly customizable and has great potential in many practical applications. © 2013 by the authors; licensee MDPI, Basel, Switzerland.