Electron channelling contrast observations in deformed Mg alloys prepared with ion milling

Abstract

Electron channelling contrast imaging (ECCI) was used in the cold-field emission scanning electron microscope (CFE-SEM) to image the microstructure on deformed bulk specimen. Imaging was conducted with a pole-piece mounted silicon photodiode detector at 5 keV to collect backscattered electrons generated from a low-tilted (0-3 degrees) specimen. Broad ion beam milling surface preparation technique was used to remove surface layers and reveal near-surface deformation features. The uniaxial hot-compression tests were conducted on Mg-0.3 wt% Al-0.2 wt% Ca alloy. ECCI observations on deformed bulk specimen showed irregular and complex channelling contrast variations inside parent grains and low angle grain boundaries originated from parent grain boundaries. ECCI on an ion milled prepared surface provides non-destructive and rapid visualisation and characterisation of strain fields along with near-surface deformation substructures in CFE-SEM.