An integrated horizon picking method for obtaining the main and detailed reflectors on sub-bottom profiler sonar image

Abstract

A sub-bottom profiler (SBP) can capture the sediment interfaces and properties of different types of sediment. Horizon picking from SBP images is one of the most crucial steps in marine sub-bottom sediment interpretation. However, traditional horizon picking methods are good at obtaining the main horizons representing the main reflectors while ignoring the detailed horizons. While detailed horizons are the prime objective, many tiny structures caused by interference echoes will also be picked. To overcome this limitation, an integrated horizon picking method for obtaining the main and detailed horizons simultaneously is proposed in this paper. A total of three main process steps: the diffusion filtering method, the enhancement filtering method as well as the local phase calculation method, are used to help obtain the main and detailed horizons. The diffusion filtering method smooths the SBP images and preserves reflectors. Enhancement filtering can eliminate outliers and enhance reflectors. The local phase can be used to highlight all of the reflections and help in the choosing of detailed horizons. A series of experiments were then performed to validate the effectiveness of the proposed method, and good performances were achieved.