Abstract
The capabilities of transmission electron microscope Hitachi HT7700 for magnetic domain structure (MDS) study of thin films using Lorentz transmission electron microscopy (LTEM) methods is discussed. Two methods of magnetic domain structure study (defocus method and aperture shift method, including low-angle electron diffraction (LAED)) in thin magnetic films were examined.
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CITATION STYLE
Volochaev, M. N., Kveglis, L. I., & Loginov, Y. Y. (2017). Lorentz microscopy methods for magnetic domain structure study. In IOP Conference Series: Materials Science and Engineering (Vol. 255). Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/255/1/012015
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