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Aberration Corrected STEM-EELS: Applications to Magnetic Materials

  • Varela M
  • Gazquez J
  • Bruno F
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 796-797
DOI: 10.1017/s1431927611004855
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Varela, M., Gazquez, J., Bruno, F., Garcia-Barriocanal, J., Torija, M., Sharma, M., … Pennycook, S. (2011). Aberration Corrected STEM-EELS: Applications to Magnetic Materials. Microscopy and Microanalysis, 17(S2), 796–797. https://doi.org/10.1017/s1431927611004855

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