Multiple energy x-ray holography: Incident-radiation polarization effects

Abstract

Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for (Formula presented) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge δ-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images. © 1997 The American Physical Society.