Abstract
We present results of dark-conductivity, photoconductivity, photoluminescence, and optical-absorption experiments on films of sputtered oxygenated amorphous-silicon-hydrogen alloys (a-Si1-xHx). Films with oxygen (O) are shown to behave much more like glow-discharge-produced a-Si1-xHx than do O-free films. O is found to enter the amorphous matrix predominantly in an Si-O-Si bridging configuration. Defects associated with the presence of H are shown to be likely centers for radiative recombination, while both O and H may be associated with locally deformable defects. © 1978 The American Physical Society.
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CITATION STYLE
Paesler, M. A., Anderson, D. A., Freeman, E. C., Moddel, G., & Paul, W. (1978). New development in the study of amorphous silicon hydrogen alloys: The story of O. Physical Review Letters, 41(21), 1492–1495. https://doi.org/10.1103/PhysRevLett.41.1492
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