Measurement and noise performance of nano-superconducting-quantum- interference devices fabricated by focused ion beam

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Abstract

Science and industry demand ever more sensitive measurements on ever smaller systems, as exemplified by spintronics, nanoelectromechanical system, and spin-based quantum information processing, where single electronic spin detection poses a grand challenge. Superconducting quantum interference devices (SQUIDs) have yet to be effectively applied to nanoscale measurements. Here, we show that a simple bilayer deposition route, combining photolithography with focused ion beam patterning, produces high performance nanoscale SQUIDs. We present results of noise measurements on these nanoSQUIDs which correspond to a magnetic flux sensitivity of around 0.2 μ 0 Hz12. This represents one of the lowest noise values achieved for a SQUID device operating above 1 K. © 2008 American Institute of Physics.

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Hao, L., MacFarlane, J. C., Gallop, J. C., Cox, D., Beyer, J., Drung, D., & Schurig, T. (2008). Measurement and noise performance of nano-superconducting-quantum- interference devices fabricated by focused ion beam. Applied Physics Letters, 92(19). https://doi.org/10.1063/1.2917580

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