Abstract
Silicon nanowires with axially varying n - and p -doping were grown by the vapor-liquid-solid approach using gold as the catalyst. The microstructures of the axial heterostructured silicon nanowires were studied using electron microscopy techniques. The nanowire sidewalls exhibit periodic nanofaceting, which is dopant-dependent. The nanofaceting occurs during the enhanced sidewall growth that arises when the diborane dopant gas is introduced. It is also found that the silicon nanowire can crystallize in a hexagonal phase, which is thermodynamically unstable in bulk silicon at ambient and may be due to the large surface stress present during the nucleation of SiNWs.
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CITATION STYLE
Li, F., Nellist, P. D., Lang, C., & Cockayne, D. J. H. (2010). Imaging and analysis of axial heterostructured silicon nanowires. Journal of Physics: Conference Series, 241, 012088. https://doi.org/10.1088/1742-6596/241/1/012088
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